Autor: Jens Lienig
ISBN-13: 9783319735573
Einband: Book
Seiten: 159
Format: 244x159x17 mm
Sprache: Englisch

Fundamentals of Electromigration-Aware Integrated Circuit Design

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Enables readers to understand and meet challenges of electromigration, including its effects on the reliability of electronic systems
Introduction.- Fundamentals of Electromigration.- Integrated Circuit Design and Electromigration.- Mitigating Electromigration in Physical Design.- Summary and Outlook.
The book provides a comprehensive overview of electromigration and its effects on the reliability of electronic circuits. It introduces the physical process of electromigration, which gives the reader the requisite understanding and knowledge for adopting appropriate counter measures. A comprehensive set of options is presented for modifying the present IC design methodology to prevent electromigration. Finally, the authors show how specific effects can be exploited in present and future technologies to reduce electromigration's negative impact on circuit reliability.
Autor: Jens Lienig, Matthias Thiele
Jens Lienig is the director of the Institute of Electromechanical and Electronic Design at Dresden University of Technology, Germany. He received his Ph.D. in the field of computer-aided physical design of multi-chip modules and was employed as a researcher at University of Virginia, Charlottesville and Concordia University, Montreal. Afterwards he worked as project manager at Tanner Research, Inc. and Robert Bosch GmbH. His main research subjects are design of electronic systems and electronic design automation. He is a member of IEEE.

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Autor: Jens Lienig
ISBN-13:: 9783319735573
ISBN: 3319735578
Erscheinungsjahr: 29.03.2018
Verlag: Springer-Verlag GmbH
Gewicht: 418g
Seiten: 159
Sprache: Englisch
Auflage 2018
Sonstiges: Buch, 244x159x17 mm, 4 schwarz-weiße und 95 farbige Abbildungen, Bibliographie