Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits

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ISBN-13:
9780387465463
Einband:
HC runder Rücken kaschiert
Erscheinungsdatum:
21.06.2007
Seiten:
352
Autor:
José Pineda de Gyvez
Gewicht:
694 g
Format:
241x160x23 mm
Sprache:
Englisch
Beschreibung:

The 2nd edition of defect oriented testing has been extensively updated. New chapters on Functional, Parametric Defect Models and Inductive fault Analysis and Yield Engineering have been added to provide a link between defect sources and yield. The chapter on RAM testing has been updated with focus on parametric and SRAM stability testing. Similarly, newer material has been incorporated in digital fault modeling and analog testing chapters. The strength of Defect Oriented Testing for nano-Metric CMOS VLSIs lies in its industrial relevance.
Functional and Parametric Defect Models.- Digital CMOS Fault Modeling.- Defects in Logic Circuits and their Test Implications.- Testing Defects and Parametric Variations in RAMs.- Defect-Oriented Analog Testing.- Yield Engineering.- Conclusion.

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